Reliability Growth Testing supports improvements in system and component Reliability over time through a systematic process of stressing the system to identify failure modes and design weaknesses. The emphasis in reliability growth testing is in finding failure modes. The reliability of the system is improved, or experiences growth, as the design is modified to eliminate failure modes. The reliability growth testing approach is sometimes referred to as Test-Analyze-Fix-Test (TAFT). A successful reliability growth program depends on a clear understanding of the intended mission(s) for the system, including the stresses associated with each mission and mission durations, and configuration control. Reliability growth testing should be a part of every development program and used to provide input to predicted sustainment needs and the reliability Key System Attributes (KSA). In addition, the results should be used in developing a realistic product support package. [1]

AcqLinks and References:

• [1] Defense Acquisition Guidebook (DAG)
• DoD Reliability Availability and Maintainability (RAM) Guide – 3 Aug 2005
• Reliability, Availability, Maintainability & Cost (RAM-C) Rationale Report Manual – 1 Jun 2009
• DoD Reliability Availability and Maintainability (RAM) Guide – 3 Aug 2005
• Reliability, Availability, Maintainability & Cost (RAM-C) Rationale Report Manual – 1 Jun 2009
• DAU Test and Evaluation Management Guide – Jan 2005

Updated: 8/5/2021